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Title: Studies of pi-bonding by X-ray crystal structure analysis
Author: McDonald, W. S.
Awarding Body: University of Glasgow
Current Institution: University of Glasgow
Date of Award: 1965
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X-ray crystal structure analyses and refinements are described of six compounds having structures in which a second-row element (aluminium, silicon, phosphorus, or sulphur) is bonded to four atoms of a first-row element (nitrogen or oxygen). The dimensions of molecules and ions of this type provide information leading to an improved understanding of the pi-bonding in compounds of the second-row elements. Least-squares refinement was used in each case to obtain atomic co-ordinates and molecular dimensions, together with the estimated standard deviations of these quantities.
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available