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Title: Diffusion in thin films
Author: Brown, Laurence C.
Awarding Body: University of Glasgow
Current Institution: University of Glasgow
Date of Award: 1961
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Diffusion coefficients and activation energies for diffusion in several successively evaporated two layer metal films have been determined by measurements of the reflectivity changes at the metal surfaces on annealing. The reflectivity changes were due to the motion of phase boundaries and it proved possible to identify the phases formed. Results indicated a vacancy diffusion mechanism rather than grain boundary diffusion and satisfactory agreement was obtained with results for the faster direction of diffusion in bulk specimens. A mechanism for the motion of the atoms was postulated in terms of a vacancy flow.
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available