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Title: 3D freeform surface measurement on coordinate measuring machine using photometric stereo method
Author: Somthong, Thammarat
ISNI:       0000 0004 7658 0857
Awarding Body: Brunel University London
Current Institution: Brunel University
Date of Award: 2017
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Surface metrology has been widely used in manufacturing for many years. There has been a wide range of techniques applied for measuring surface topography. A photometric stereo technique is one of the best ways for the analysis of three-dimensional (3D) surface textural patterns. Many published works are concerned the developed approach for recovering the 3D profiles from surface normal. This research not only presents a methodology used to retrieve the profiles of surface roughness standards but also investigates the uncertainty estimation of textural measurement determined by the photometric stereo method. Various input quantities have been studied such as pixel error from recovered 3D surface textural patterns, the power of light source which involved with surface roughness average (Ra) value and the effect of room temperature. The surface roughness standards were utilized as the reference value. In term of increasing accuracy of the reference value, a contact method (stylus instrument) was used to calibrate them. Illumination angles of light source had some influence on the measurement results. A coordinate measuring machine (CMM) was used for holding the light source in order to study the effects of tilt and slant angles. The effect of tilt and slant angles were investigated. The results of these experiments successfully indicated that the angle used in photometric stereo method played an important role to the accuracy level of the roughness measurement results. The surface roughness specimen manufactured by a Computer Numerical Control (CNC) was applied to validate the capability of the photometric stereo system.
Supervisor: Yang, Q. P. Sponsor: Ministry of Sciences and Technology, Royal Thai Government ; National Institute of Metrology Thailand (NIMT)
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Measurement uncertainty ; Metrology ; Measurement traceability ; Surface roughness