Use this URL to cite or link to this record in EThOS: https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.711851
Title: Experimental and theoretical techniques for quantum-enhanced metrology and optical quantum information processing
Author: Humphreys, Peter Conway
ISNI:       0000 0004 6061 3984
Awarding Body: University of Oxford
Current Institution: University of Oxford
Date of Award: 2015
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Abstract:
Over the last few decades, quantised excitations of the electromagnetic field have proven to be an ideal system with which to investigate and harness quantum optical phenomena. The techniques developed have enabled fundamental tests of quantum mechanics as well as practical applications in quantum metrology and quantum information processing. Advancing to larger-scale entangled quantum systems will open up new regimes of quantum many-body physics, allowing us to probe the limits of quantum mechanics and enabling truly quantum-enhanced technologies. However, moving towards this goal will require further experimental and theoretical innovations. The work described in this thesis focuses on several different aspects of optical quantum information, but are ultimately all linked by this long-term aim. The first part of this thesis describes a novel method for strain-based active control of quantum optical circuits and a new method for the characterisation of high efficiency detectors. Building on this, I discuss in detail two different fields of quantum optics that stand to benefit from these techniques. I initially consider quantum-enhanced metrology, including work aimed towards demonstrating a truly better-than-classical phase measurement, and a theoretical exploration of multiple-phase estimation. Finally, I focus on linear-optical quantum information processing, exploring in detail the use of time-frequency encodings for quantum computing.
Supervisor: Walmsley, Ian A. Sponsor: Engineering and Physical Sciences Research Council
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.711851  DOI: Not available
Keywords: Physics ; Quantum metrology ; Quantum information processing ; Quantum optics
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