| Use this URL to cite or link to this record in EThOS: | https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.691539 |
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| Title: | Intensity measurements on RHEED patterns from the silicon (001) surface | ||||||
| Author: | Norton, N. G. | ||||||
| Awarding Body: | University of London | ||||||
| Current Institution: | Imperial College London | ||||||
| Date of Award: | 1984 | ||||||
| Availability of Full Text: |
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| Abstract: | |||||||
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No abstract available
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| Supervisor: | Not available | Sponsor: | Not available | ||||
| Qualification Name: | Thesis (Ph.D.) | Qualification Level: | Doctoral | ||||
| EThOS ID: | uk.bl.ethos.691539 | DOI: | Not available | ||||
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