Use this URL to cite or link to this record in EThOS:
Title: Electron diffraction analysis of amorphous Ge2Sb2Te5
Author: Chen, Yixin
Awarding Body: University of Oxford
Current Institution: University of Oxford
Date of Award: 2010
Availability of Full Text:
Full text unavailable from EThOS.
Please contact the current institution’s library for further details.
No abstract available
Supervisor: Cockayne, D. J. H. Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Electrons--Diffraction ; Texture (Crystallography) ; Amorphous semiconductors