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Title: Detection and decoding algorithms for nanoscale data storage
Author: Parnell, Thomas P.
ISNI:       0000 0004 2723 7622
Awarding Body: University of Warwick
Current Institution: University of Warwick
Date of Award: 2010
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Scanning probe technology can be used for the modification of surfaces on the nanoscale and therefore has potential applications for data storage: data can be stored as a sequence of indentations in a polymer medium for example. In order to achieve the throughput requirements of a modern storage device the proposed probe storage systems consist of large arrays of probes reading/writing/erasing data in parallel. One of the most important tasks when designing a commercial storage device is to ensure that data can always be retrieved with a very low probability of error. The small scales offered by probe storage can potentially allow very high areal densities of information storage (larger than 1Tbit/in2) but there is a price to pay: many distortions arise when trying to retrieve this data (positioning errors for example) that make it harder to determine the correct information originally stored by the user. This thesis is concerned with signal processing for probe storage. Firstly channel models are developed for the read-back signal from a probe storage device that take into account the various distortions that occur. These models are then used for the design of probabilistic data detection algorithms and error-correcting codes that ensure the probability of error associated with data retrieval is sufficiently low. These intensively mathematical algorithms are designed with their complexity in mind to ensure they allow an implementation that satisfies the silicon area, power and timing constraints of a highly parallelized probe storage device. Making use of the tools provided by such fields as information theory, probability theory and asymptotic analysis the performance of these signal processing algorithms is studied theoretically and fundamental limits concerning the performance of a probe storage device are computed. The system-level implications of these results are carefully considered.
Supervisor: Not available Sponsor: Great Britain. Royal Commission for the Exhibition of 1851
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: QA Mathematics ; TK Electrical engineering. Electronics Nuclear engineering