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Title: Evaluation of microwave microscopy for dielectric characterisation
Author: Barker, Duncan James
ISNI:       0000 0004 2699 8534
Awarding Body: University of Birmingham
Current Institution: University of Birmingham
Date of Award: 2010
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A widely used analytical, image charge, model of the SNMM was analysed for the first time in terms of its ability to predict the response of the SNMM to both bulk and thin film dielectrics. For the first time it was shown that the uncertainty in fitting to the model reduces from 10% to 5% when the length of the tip protruding from within the cavity is reduced from 2mm to 1mm. A 5% uncertainty in fitting to the image charge model for the measurement of the relative permittivity of bulk samples is demonstrated.
Supervisor: Not available Sponsor: EPSRC
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: TK Electrical engineering. Electronics Nuclear engineering ; TA Engineering (General). Civil engineering (General) ; QC Physics