Use this URL to cite or link to this record in EThOS:
Title: A novel approach for dynamic specification testing of high-resolution ΣΔ analogue-to-digital converters
Author: Georgopoulos, Konstantinos
ISNI:       0000 0004 2674 7380
Current Institution: Lancaster University
Date of Award: 2007
Availability of Full Text:
Access from EThOS:
Modern day dynamic specification testing of high-resolution mixed-signal devices, such as the ΣΔ analogue-to-digital converter, has revealed a multitude of challenges. These intricacies are mainly associated with the output data record size which needs to be captured in order to perform dynamic specification analysis. The unavoidable consequence is that of significantly long test times that have a direct impact upon the manufacturing cost. In addition, the continuous scaling down of transistor dimensions and power supply range minimisation means that the performance of high-resolution ADC's can be significant: influenced by noise interference and internal non-idealities. Therefore, an accurate and costefficient dynamic specification testing technique remains greatly in demand. This thesis identifies the main bottlenecks associated with modem day industrial dynamic specification testing through the off-chip use of the Fast Fourier Transform. These are mainly split into two categories: 1. The FFT algorithm requires significantly large data sets which lead to long data capture, transfer and processing time 2. The FFT algorithm is prohibitively large for on-chip realisation when data sets for high-resolution ΣΔ dynamic specification testing are considered.
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available