Use this URL to cite or link to this record in EThOS:
Title: Electron Microscopy of Low Energy Ion Damage in Metals.
Author: Thomas, G. J.
Awarding Body: University of Sussex
Current Institution: University of Sussex
Date of Award: 1969
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available