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Title: Reliability Assessment Techniques for Silicon Planar Semiconductor Components and Impatt Diodes.
Author: Sinnadurai, F. N.
ISNI:       0000 0001 3416 1724
Awarding Body: University of Southampton
Current Institution: University of Southampton
Date of Award: 1978
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available