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Title: Transmission electron microscopy of defects in silicon.
Author: Salisbury, I. G.
ISNI:       0000 0001 3547 2348
Awarding Body: University of Birmingham
Current Institution: University of Birmingham
Date of Award: 1978
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available