Use this URL to cite or link to this record in EThOS: https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.471056
Title: The effect of anisotropic stress on 1/f noise in silicon p-n junction diodes
Author: Rout, Colin
ISNI:       0000 0001 3538 4313
Awarding Body: University of Exeter
Current Institution: University of Exeter
Date of Award: 1978
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.471056  DOI: Not available
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