Use this URL to cite or link to this record in EThOS:
Title: An Investigation of Charge Storage Effects Induced by High Energy Electron Bombardment of Insulated Gate Field Effect Devices.
Author: Price, J. C.
ISNI:       0000 0001 3500 3189
Awarding Body: University of London
Current Institution: University of London
Date of Award: 1976
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available