| Use this URL to cite or link to this record in EThOS: | https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.467508 |
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| Title: | Observation of defects in device silicon | ||||||
| Author: | Ogden, Raymond |
ISNI:
0000 0001 3455 2821
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| Awarding Body: | University of London | ||||||
| Current Institution: | Imperial College London | ||||||
| Date of Award: | 1977 | ||||||
| Availability of Full Text: |
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| Abstract: | |||||||
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No abstract available
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| Supervisor: | Not available | Sponsor: | Not available | ||||
| Qualification Name: | Thesis (Ph.D.) | Qualification Level: | Doctoral | ||||
| EThOS ID: | uk.bl.ethos.467508 | DOI: | Not available | ||||
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