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Title: A T.E.M. study of the defect structure of ion implanted silicon.
Author: Lambert, J. A.
ISNI:       0000 0001 3604 3318
Awarding Body: University of Birmingham
Current Institution: University of Birmingham
Date of Award: 1978
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available