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Title: The generation of diagnostic tests for large, multi-ouput combinational networks
Author: Butland, Stanley David
ISNI:       0000 0001 3512 233X
Awarding Body: University of Bradford
Current Institution: University of Bradford
Date of Award: 1977
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A test generation procedure based on a backwards trace path sensitisation technique, and its implementation by computer program are described. The test generation procedure is designed to generate a minimal or near minimal set of tests for a wide range of multi-output networks. The larger networks are taken from a hardware specification of the ICL 1906A floating point unit, and range in complexity from a single output, 75 input network to the main argument mill entailing 243 inputs, 80 outputs, over 2600 elements, and over 75000 separate paths. The test generation technique developed adopts a procedure designed to differentiate between individual faults on the basis of application of single tests as well as on the application of the test series generated. For each test specified, the effect of every single fault has been simulated and all faulty patterns are stored together with their associated causes. A comparison of the effects of each fault over a complete test set is shown to yield precise diagnostic information. Results of the adoption of the backwards trace path sensitisation technique are compared with those derived from an alternative path tracing technique.
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available