| Use this URL to cite or link to this record in EThOS: | https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.444967 |
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| Title: | Chalcogenide thin film materials for next generation data storage | ||||||
| Author: | Simpson, Robert E. |
ISNI:
0000 0001 3413 6262
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| Awarding Body: | University of Southampton | ||||||
| Current Institution: | University of Southampton | ||||||
| Date of Award: | 2008 | ||||||
| Availability of Full Text: |
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| Abstract: | |||||||
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Data can be stored in the form of amorphous and crystalline marks within a chalcogenide thin film. Commonly Ge. Therefore Ga:La:S:Cu shows potential as a future electrical phase change data storage material.
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| Supervisor: | Not available | Sponsor: | Not available | ||||
| Qualification Name: | Thesis (Ph.D.) | Qualification Level: | Doctoral | ||||
| EThOS ID: | uk.bl.ethos.444967 | DOI: | Not available | ||||
| Keywords: | TK Electrical engineering. Electronics Nuclear engineering ; QC Physics | ||||||
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