Electronic Speckle Pattern Shearing Interferometry (ESPSI) or shearography has successfully been used in NDT for slope (δw/δx and/or δw/δy) measurement while strain measurement (δu/δx, δv/δy, δu/δy and δv/δx) is still under investigation This method is well accepted in industrial applications especially in the aerospace industry. Demand of this method is increasing due to complexity of the test materials and objects. ESPSI has successfully performed in NOT only for qualitative measurement whilst quantitative measurement is the current aim of many manufacturers. Industrial use of such equipment is being completed without considering the errors arising from numerous sources, including wavefront divergence. The majority of commercial systems are operated with diverging object illumination wavefronts without considering the curvature of the object illumination wavefront or the object geometry, when calculating the interferometer fringe function and quantifying data. This thesis reports the novel approach in quantified maximum phase change difference analysis for derivative out-of-plane (OOP) and in-plane (IP) cases that propagate from the divergent illumination wavefront compared to collimated illumination.