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Title: Structural characterisation of silicon-germanium virtual substrate-based heterostructures grown by low pressure chemical vapour deposition
Author: Mihai-Dilliway, Gabriela Delia
ISNI:       0000 0001 3397 9508
Awarding Body: University of Southampton
Current Institution: University of Southampton
Date of Award: 2002
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Silicon-germanium heterostructures incorporating compositionally gradually virtual substrates are important for the fabrication of a variety of advanced electronic devices. Their successful application depends critically on their surface morphology and defect content. The aim of this research project is to characterise the way in which these structural properties are influenced by the growth parameters used in low pressure chemical vapour deposition (LPCVD) at the Southampton University Microseletronics Centre (SUMC). To this end, a comparative study of the surface quality and the distribution and density of misfit strain relaxation induced defects in SiGe virtual substrate-based heterostructures grown under varying conditions, was carried out. The growth parameters varied have been: growth temperature, initial and final Ge content, Ge concentration gradient, type of Ge grading profile (linear and stepwise) in the virtual substrate, and thickness and presence of a device structure in the capping layer of constant composition. Characterisation was performed using Nomarski differential interference contrast microscopy, atomic force microscopy (AFM) and transmission electron microscopy (TEM). Growth conditions combining a temperature of 800°C and a Ge concentration variation in the virtual substrate between 13% and 42% were found to activate an inefficient misfit strain relaxation mechanism in linear-graded heterostructures, whereby dislocation nucleation prevails over dislocation motion to relieve the misfit strain. Results showed rough surfaces with deep trenches and deep faceted pits, a high density of short misfit dislocation segments extending well into the capping layer of constant composition and a high density of threading dislocations reaching the surface. Additionally, threading dislocation pileups were observed at faceted pits. At lower growth temperatures (750°C) and for a Ge concentration variation in the virtual substrate between 12% ad 42%, both surface morphology and defect configuration were improved. Furthermore, the step variation of the Ge composition in the virtual substrate was found to activate a misfit strain relaxation mechanism that resulted in superior surface quality than that obtained with linear grading.
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Structural properties