Use this URL to cite or link to this record in EThOS:
Title: Surface and bulk traps in materials and devices for GaAs integrated circuits
Author: Blight, S. R.
ISNI:       0000 0001 3467 9697
Awarding Body: University of Wales Institute of Science and Technology (UWIST)
Current Institution: Cardiff University
Date of Award: 1987
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: MESFETs trapping levels