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Title: Silicon sublimation at ultra high vacuum with microprocessor monitoring and measurements
Author: Al-Rawi, S. A. N.
ISNI:       0000 0001 3408 073X
Awarding Body: University of Kent
Current Institution: University of Kent
Date of Award: 1988
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Thin film measurement