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Title: Characterization of semi-insulating polycrystalline silicon
Author: Brunson, K. M.
ISNI:       0000 0001 3506 3210
Awarding Body: University of Bradford
Current Institution: University of Bradford
Date of Award: 1987
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Properties of SIPOS films