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Title: The measurement of electrical parameters and trace impurity effects in MOS capacitors
Author: McGillivray, Ian Grant
ISNI:       0000 0001 3624 2480
Awarding Body: University of Edinburgh
Current Institution: University of Edinburgh
Date of Award: 1987
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Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Microelectronic component test