Use this URL to cite or link to this record in EThOS:
Title: Analogue reliability tests on digital integrated circuits.
Author: Xu, Y.
ISNI:       0000 0001 3573 9540
Awarding Body: University of Lancaster
Current Institution: Lancaster University
Date of Award: 1986
Availability of Full Text:
Access from EThOS:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Circuits