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Title: Ellipsometric and photometric techniques for the measurement of the optical constants of thin films and surfaces
Author: Attrill, K. J.
ISNI:       0000 0001 3432 5821
Awarding Body: University of Bradford
Current Institution: University of Bradford
Date of Award: 1986
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Solid-state physics