Use this URL to cite or link to this record in EThOS:
Title: Fault-oriented testing of MOS circuits
Author: Burgess, N.
ISNI:       0000 0001 3509 683X
Awarding Body: University of Southampton
Current Institution: University of Southampton
Date of Award: 1986
Availability of Full Text:
Access from EThOS:
Full text unavailable from EThOS. Please try the link below.
Access from Institution:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Circuits