| Use this URL to cite or link to this record in EThOS: | https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.367048 |
|
|||||
| Title: | Growth and characterisation of anodic oxide and sulphide films on Cdâ†xHgâ†1â†-â†xTe (CMT) using in-situ ellipsometry and surface second harmonic generation. | ||||
| Author: | Wark, Alastair William. |
ISNI:
0000 0001 3563 4271
|
|||
| Awarding Body: | University of Strathclyde | ||||
| Current Institution: | University of Strathclyde | ||||
| Date of Award: | 2000 | ||||
| Availability of Full Text: |
|
||||
| Abstract: | |||||
|
No abstract available
|
|||||
| Supervisor: | Not available | Sponsor: | Not available | ||
| Qualification Name: | Thesis (Ph.D.) | Qualification Level: | Doctoral | ||
| EThOS ID: | uk.bl.ethos.367048 | DOI: | Not available | ||
| Keywords: | Optical properties | ||||
| Share: | |||||