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Title: The hot carrier induced degradation of Si/SiO←2 interface.
Author: Al-Kofahi, Idrees Solaiman Ali.
ISNI:       0000 0001 3406 7682
Awarding Body: Liverpool John Moores University
Current Institution: Liverpool John Moores University
Date of Award: 1997
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Semiconductors; MOSFETs