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Title: Studies in thin film systems and X-ray multilayer film design
Author: Gu, Erdan
ISNI:       0000 0001 3521 5579
Awarding Body: University of Aberdeen
Current Institution: University of Aberdeen
Date of Award: 1992
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The design and optimization of soft X-ray multilayer film mirrors have been studied using optical theory. Our investigations show that the reflectivity of multilayer films is sensitive to their modulation wavelength and that their reflectivity can be improved by structural optimization. A new design method has been developed which can be used to increase the bandwidth and to change the shape of the reflectivity curves of multilayer film mirrors. Detailed studies of the formation and structure of practical vacuum deposited erbium(Er) thin film systems are presented. It was found that the phase and structure of these deposited films are strongly influenced by deposition conditions and film thickness. On the basis of these studies, very high purity low thicknesss erbium films (&'60 300 AA) with h.c.p. structure have be grown for the first time. The preferred orientation of crystallites and its dependence on deposition conditions in these erbium films are also investigated in detail. We have prepared Er/C multilayer films using the ultra high vacuum electron beam evaporation technique. The compositional periodic structure and intra-layer structure of these multilayer films have been studied using X-ray diffraction. The diffusion and short-range order formation occurring at the interfaces and within layers of C-Er thin-film systems and Er/C multilayer films were investigated by extended X-ray absorption fine structure technique (EXAFS).
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Solid-state physics