Use this URL to cite or link to this record in EThOS:
Title: Electromigration in integrated circuit interconnects.
Author: Clarke, Peter John.
ISNI:       0000 0001 3558 3152
Awarding Body: South Bank University
Current Institution: London South Bank University
Date of Award: 1993
Availability of Full Text:
Access from EThOS:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Circuits