Use this URL to cite or link to this record in EThOS:
Title: On-chip testing of very large scale integrated circuits.
Author: Varma, P.
ISNI:       0000 0001 3542 8611
Awarding Body: University of Manchester Institute of Science and Technology
Current Institution: University of Manchester
Date of Award: 1984
Availability of Full Text:
Access from EThOS:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Integrated circuit tests