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Title: Testing and fault location in analogue systems via pattern recognition techniques
Author: Vargheses, K. C.
ISNI:       0000 0001 3542 8064
Awarding Body: University of Wales Institute of Science and Technology
Current Institution: Cardiff University
Date of Award: 1980
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Pattern recognition & image processing