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Title: Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits.
Author: A'Ain, Abu Khari Bin.
ISNI:       0000 0001 3388 412X
Awarding Body: University of Lancaster
Current Institution: Lancaster University
Date of Award: 1996
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Circuit testing; Fault detection