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Title: High-level design for testability
Author: Shi, Cheng
ISNI:       0000 0001 3404 7737
Awarding Body: University of Southampton
Current Institution: University of Southampton
Date of Award: 1993
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Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Circuits