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Title: Computer controlled capacitance transients determination of defect centres in epitaxial silicon.
Author: Marshall, A.
ISNI:       0000 0001 3619 5485
Awarding Body: Trent Polytechnic
Current Institution: Nottingham Trent University
Date of Award: 1984
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Electronics and electrical engineering