Use this URL to cite or link to this record in EThOS:
Title: Theoretical and empirical studies in VLSI complexity theory.
Author: Williams, Alan John.
ISNI:       0000 0001 2413 2815
Awarding Body: University of Leeds
Current Institution: University of Leeds
Date of Award: 1989
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Circuits