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Title: An assessment of supply current measurement (IDDQ) as a reliability indicator for CMOS integrated circuits.
Author: Richardson, A. M. D.
ISNI:       0000 0001 2420 3177
Awarding Body: University of Lancaster
Current Institution: Lancaster University
Date of Award: 1991
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Integrated curcuit testing