Use this URL to cite or link to this record in EThOS:
Title: Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials.
Author: Laczik, Z.
ISNI:       0000 0001 3603 6337
Awarding Body: University of Oxford
Current Institution: University of Oxford
Date of Award: 1992
Availability of Full Text:
Full text unavailable from EThOS.
Please contact the current institution’s library for further details.
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Semiconductor technology