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Title: Electron beam testing technology for high-speed device characterisation.
Author: Thong, John Thiam Leong.
ISNI:       0000 0000 4525 5622
Awarding Body: University of Cambridge
Current Institution: University of Cambridge
Date of Award: 1989
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available