Use this URL to cite or link to this record in EThOS:
Title: On fault simulation of digital circuits by critical path tracking.
Author: Chen, C.
ISNI:       0000 0001 3531 0226
Awarding Body: Cranfield Institute of Technology
Current Institution: Cranfield University
Date of Award: 1992
Availability of Full Text:
Access from EThOS:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Circuits