Use this URL to cite or link to this record in EThOS:
Title: A test strategy planning methodology driven by economic parameters.
Author: Dear, Ian D.
ISNI:       0000 0001 3421 2085
Awarding Body: Brunel University
Current Institution: Brunel University
Date of Award: 1990
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Integrated circuit testing