Use this URL to cite or link to this record in EThOS:
Title: Deductive diagnosis of multiple faults in combinational digital electronic circuits by analysis of critical paths
Author: Sangwine, S. J.
ISNI:       0000 0001 3551 4691
Awarding Body: University of Reading
Current Institution: University of Reading
Date of Award: 1991
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Circuits