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Title: The study of defects in bismuth germanium oxide (Bi←1←2GeO←2←0) using phonon echoes and other techniques.
Author: Terry, Ian.
ISNI:       0000 0001 3516 2999
Awarding Body: University of Lancaster
Current Institution: Lancaster University
Date of Award: 1988
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Semiconductor defects