Use this URL to cite or link to this record in EThOS:
Title: Ionising radiation induced surface effects in charged coupled devices.
Author: Roy, Thiery Jacques.
ISNI:       0000 0001 3539 0529
Awarding Body: Brunel University
Current Institution: Brunel University
Date of Award: 1994
Availability of Full Text:
Access from EThOS:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Radiation damage; Semiconductors