Use this URL to cite or link to this record in EThOS:
Title: The electronic properties of defects in amorphous semiconductors
Author: O'Reilly, E. P.
ISNI:       0000 0001 3454 1356
Awarding Body: University of Cambridge
Current Institution: University of Cambridge
Date of Award: 1981
Availability of Full Text:
Full text unavailable from EThOS.
Please contact the current institution’s library for further details.
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Components