Use this URL to cite or link to this record in EThOS:
Title: An investigation into defect and fault tolerant interconnect techniques for WASP devices.
Author: Alhaji Hussaini, Mohammed Baba.
ISNI:       0000 0001 3411 416X
Awarding Body: Brunel University
Current Institution: Brunel University
Date of Award: 1995
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available