Use this URL to cite or link to this record in EThOS:
Title: Deep level traps and ionization coefficients of electronics and holes in InP
Author: Choudhury, A. N. M.
ISNI:       0000 0001 3548 4090
Awarding Body: University of Sheffield
Current Institution: University of Sheffield
Date of Award: 1980
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Electronics and electrical engineering