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Title: Deep level transient spectroscopy studies of various silicon substrates.
Author: Ahmed, Mahfuza.
ISNI:       0000 0001 3402 0294
Awarding Body: Brunel University
Current Institution: Brunel University
Date of Award: 1998
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Silicon detectors; Radiation-induced defects