Use this URL to cite or link to this record in EThOS:
Title: Positron beam study of technological films.
Author: Saleh, Abdelnaser
ISNI:       0000 0001 3546 5279
Awarding Body: Royal Holloway, University of London
Current Institution: Royal Holloway, University of London
Date of Award: 1996
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Crystal lattice defects; Silicon